Consider avalanche breakdown in a silicon junction. The n-region is uniformly doped with a donor density. Assume that breakdown occurs when the magnitude of the electric field at any point in the device becomes equal to the critical field . Assume to be independent of. If the built-in voltage of the junction is much smaller than the breakdown voltage, , the relationship between and is given by
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| Topic | Questions | Attempted | Correct | |
|---|---|---|---|---|
| Network Analysis | 273 | 0 | 0 | |
| Electronic Devices | 69 | 0 | 0 | |
| Analog Electronics | 395 | 0 | 0 | |
| Digital Electronics | 351 | 0 | 0 | |
| Signals and Systems | 22 | 0 | 0 | |
| Control Systems | 224 | 0 | 0 | |
| Communication System | 200 | 0 | 0 | |
| EMFT - ECE | 14 | 0 | 0 | |
| Engineering Mathematics | 24 | 0 | 0 | |
| General Aptitude | 30 | 0 | 0 |







